ARM has selected XJTAG’s boundary scan development system for debugging and testing its range of
ARM RealView development hardware tools.
The microprocessor firm is using the boundary scan system on its RealView platform baseboards, which contain multiple high pin-count ball grid array devices.
“With tens of thousands of pins on each board, we recognised it would not be possible to validate these circuits in a commercially realistic timescale without a boundary scan test system,” said Spencer Saunders, engineering manager for system design at ARM.
Combining the boundary scan description language files for JTAG-compliant components with test scripts written for each device and the board netlist itself, the
XJTAG boundary scan system will calculate how to manipulate the JTAG chain in order to access as many nets as possible, including those with non-JTAG devices. Board design changes are accommodated by recompiling using the revised netlist.