Aeroflex is working with semiconductor company Altair Semiconductor to support the roll-out of 3G Long Term Evolution (LTE) networks and terminals.
The focus of the collaboration is to create interoperability testing (IOT) to enable joint customer development and testing on a pre-tested and qualified User Equipment (UE) test setup.
As a result Altair has ordered 7100 LTE digital radio test sets from Aeroflex.
According to Eran Eshed, co-founder and v-p of marketing and business development for Altair Semiconductor. "We had already done all of the prep work to ensure a seamless integration. As LTE expands on a global scale, we look forward to further expanding our collaboration with Aeroflex."
Altair's FourGee LTE USB ExpressCard UE is a test and IOT UE platform for system vendors and carriers involved in the development, trialing, and deployment of LTE systems.
It is also a reference design for terminal manufacturers working to develop commercial products based on the FourGee family of LTE chips.
"We've worked closely together to prove Altair's and Aeroflex's new LTE products. We are very pleased with the success," said Ryan Panos, vice president of global sales, Aeroflex Test Solutions.
Altair and Aeroflex will be at GSMA 2010 Mobile World Congress in Barcelona, February 15-18, 2010.