JTAG Technologies claims to have a test package that reduces the cost of designing built-in test access for boundary-scan testing and on-board device programming.
The aim is to remove the need for a separate JTAG test interface controller which can now be integrated into an existing USB interface.
“For the first time since the introduction of the IEEE Std. 1149.1 in 1990, existing USB to JTAG resources on boards can be linked to boundary-scan test software,” said the company.
The boundary scan test firm has worked with FTDI to offer a support option for the transceiver supplier’s FTDI 2232D and FT2232H/4232H (Hi-speed USB 2.0) devices that allow direct connection from PC to target (UUT) via a standard USB cable.
“Once designed into a board and configured appropriately, the FTDI parts act the same as a regular JTAG controller that can be selected from our software’s instruments menu,” said Peter van den Eijnden, managing director for JTAG Technologies.
The aim is to improve the usefulness of boundary-scan build-in test techniques by making JTAG more cost-effective to implement in PCB design and servicing activities.