The ElectroTestExpo consortium has announced the date of its second free-to-attend event for electronics design and test engineers - 7th April 2011. The venue? A return to Bletchley Park Mansion, former home of the WWII code breakers and now host to the National Museum of Computing.
The event combines presentations from industry experts, an end of day panel session and an exhibition area. After the day's formal proceedings, up to 50 attendees can join in a guided tour of the museum on a first-come-first-served basis; with pre-registered applicants taking priority.
Each presentation will last approximately 40 minutes, allowing time for Q & As, and topics will include: power supply measurements and analysis; self-test of switching matrices; and JTAG for functional test.
"The challenges in today's test environment require a more focused approach than the traditional, wide-ranging exhibition can deliver," said ElectroTestExpo consortium member Nigel Adams, of Aeroflex. "ElectroTestExpo is specifically aimed to address the needs of engineers looking to reduce cost and test times while improving measurement quality. Aeroflex is pleased so support this event."
Exhibitors currently include Tektronix, GeoTest, JTAG Technologies, Aeroflex, Aster, MAC Panel, Pico Technology, TestWorks and Pickering Interfaces.
For more information and registration, see http://www.electrotestexpo.co.uk
ElectroTestExpo describes itself as "an 'ad hoc' consortium of like-minded T&M and ATE companies looking to involve their customers in an interesting yet informal manner". It is run on a not-for-profit basis by the combined efforts of the sales and marketing teams of the consortium member companies. For further details mail info@electrotestexpo.co.uk.