Detrimental voids have been discovered in Pb-free solder joints,
according to a University of
Leicester researcher.
The researcher, post-graduate Sergey Belyakov, is taking a deep
look at Pb-free soldering for the University's materials research
group.
"I have discovered a process which has not been described yet:
the formation of crystallographically-faceted voids in the bulk of
lead-free solders," Belyakov told Electronics Weekly.
The results are new and Belyakov only has preliminary
results.
"They are constantly observed. This is very undesirable effect
which needs to be terminated," he said. "At the moment I am trying
to investigate the nature of this phenomenon to propose possible
ways of avoiding it."
Traditional lead-based alloys have a long history and there has
been extensive investigation of their micro-structural stability
and reliability.
"New solder materials have been proposed to replace the
traditional alloys but there may be a deterioration in the
reliability of solder-joints," said Belyakov. "The objective of the
research is to bridge the technical gaps and meet the challenges of
lead-free solder application in the electronics industry through
the fundamental understanding of lead-free assembly and reliability
issues."
Like other research, the Leicester programme has not found a
clear reliability winner between Pb-inclusive and Pb-free solder
joints.
"The picture is mixed: in some conditions lead-containing solder
joints last longer, in some lead-free ones," said Belyakov.
For example: "Pb-free solders better sustain high-temperature
operational conditions, whereas Pb-containing ones could be
plastically deformed and re-crystallise under temperatures higher
than 125 C," he said. "However, lead-free solders' ability to wet
solder pads is poorer compared to lead-containing ones."
Belyakov provided some detailed examples of differences between
the two solder groups:
"Due to considerable undercooling before crystallisation, up to
30C, lead-free solder joints produce lower amount of the [beta]-Sn
grains upon solidification. Further it was shown that due to
anisotropy of the coefficient of thermal expansion of the [beta]-Sn
phase, during thermal cycling a fracture occurs along the grain
boundaries. Since lead-containing solder joints consisted of a vast
amount crystallographically disoriented grains, they failed
considerably earlier compared to the solder joints assembled with
use of SAC405 solder."
On the other hand
"Large amount of undercooling in lead-free solders promotes
pro-eutectic intermetallic phase development to a big scale, up to
50microns, during solidification, which could deteriorate
mechanical properties of a solder joint, since physical and
mechanical properties of the intermetallic phases differ from those
of matrix material."
![Crystallographically faceted voids (CFV) in the microstructure of lead-free solder joints. The CFV are always correlated with [beta]-Sn grain crystallographic orientation.](http://www.electronicsweekly.com/assets/getAsset.aspx?ItemID=53127)

Crystallographically faceted voids (CFV) in the
microstructure of lead-free solder joints. The CFV are always
correlated with [beta]-Sn grain crystallographic
orientation.