Q5 interview - Simon Payne, XJTAG (Electro-ramblings)

Q5 interview - Simon Payne, XJTAG

The latest Q5 interview with Simon Payne, CEO of boundary scan test firm XJTAG, has just gone live.

He reveals his thoughts on UK electronics events, the competitiveness of the market for boundary scan technology, and problems with component circuitry.

The five short sharp questions this week are:

* We hear you reckon the UK needs to sort out its electronics events. Why?

* Do you still get something out of attending exhibitions/conferences?

* Has the "XJTAG-Inside" idea taken off for your boundary scan technology?

* Is the market for boundary scan technology getting more competitive?

* Does boundary scan always spot problems with component circuitry?

Read his answers in the full interview: Q5 interview - Simon Payne, XJTAG

Simon Payne

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Posted by Alun Williams on February 7, 2008 5:09 PM | Permalink

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