Subscribe to this blog's feed
Take a look at another Circuit Design Idea we have uploaded to the site.It covers the use of a microcontroller in a nonstandard task, not just detecting a pulse but detecting it as part of a wider dozen tests and measurements.
The Design Idea begins:
While recently designing an automatic test station employing a microcontroller, I faced a nonstandard task: Detect the presence or the absence of output pulses in the DUT (device under test). You might think this task is easy to accomplish by connecting an LED to the DUT output. The blinking LED provides evidence of the pulse's presence. That approach would work if that test were the only one you needed to perform.
In this station, however, the pulse test is just one of more than a dozen tests and measurements. The test station should display the final result - pass or fail - only after completing all the tests. So, it should represent the result of each test in binary format - that is, yes for pass or no for fail. This Design Idea describes a simple way of solving this problem.It is courtesy of Abel Raynus, Armatron International (Edited by Martin Rowe and Fran Granville - EDN)
View all the Design Ideas on Electronics Weekly
Recent Comments