Test firms come to Embedded Live

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Tektronix will be leading the way for test firms at Embedded Live Exhibition, which is due to take place at Earl's Court, London in 19-21 October.

More big name test firms are expected to present their oscilloscopes, analysers and generators, which are used so extensively in embedded system design.

"In step with increasing functionality and performance, engineers often have to work with both analogue and digital signals in their designs," says Trevor Smith from Tektronix.

According to Smith, analogue testing, for example, requires precise voltage values for performing physical layer analysis such as amplitude, timing or eye diagram measurements.

"The oscilloscope has been the primary tool for this job. Digital system test uses only logic state values and may use timing information only," says Smith.

"By time-correlating multiple digital signals, bus or protocol-level analysis can be performed. Digital system test and debug may require triggering on specific bus cycles, such as a memory read or write. Logic analysers with wide bus capabilities are typically used for digital system test," says Smith.

He adds: "In many cases, when hardware and software engineers are working together to troubleshoot the root cause of a specific problem, they require a view of information on a bus - both its electrical representation and also at a higher level of abstraction, such as the decoded view of a serial bus protocol."

The Embedded Live Exhibition and Conference brings together the EE Times Group's Embedded Systems Conference and Electronics Weekly Live, organised by Reed Business Information.

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This page contains a single entry by Richard Wilson published on July 2, 2010 4:40 PM.

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