Agilent seminar addresses measuring complex materials

Agilent is hosting a free day-long seminar on the topic of measuring complex materials. It will cover the fundamentals of impedance measurements, techniques of characterizing complex materials, how to measure material/component properties in nano-scale resolution and conclude with a session focused on emerging novel materials research challenges. There will be guest speakers from the University of Cambridge and Agilent’s partner, Thomas Keating.

Engineers and Researchers working today in education, communications, wireless, aerospace and defence industries with functional, novel materials and their components are faced with increasingly complex measurement challenges and rapidly changing technology, say the organisers.

“Special guest speaker from the Cambridge Graphene Centre, Dr. Shakil A Awan, will be sharing his thoughts on measurement challenges and research on graphene. Application and product experts from Agilent will be on-hand to give demonstrations and technical presentations around the latest innovations, features and capabilities. You will also get the chance to book a 1-1 session with the experts to discuss your application on a first come first served basis (Limited Spaces available).”

The event is aimed at R&D, QA, Design and Manufacturing Engineers, and researchers who are working with materials and designing state-of-the-art electronic devices and components.

“Throughout the day we will be running personal and specialized drop-in sessions with our team of application engineers. They will be able to discuss your application and measurement challenges, or run a special hands-on session with test and measurement equipment,” says Agilent. “Each session will last approximately 20 minutes and registration for the Application Clinic is on a first-come, first-served basis, with a limited amount of time slots.”

It will take place on Tuesday 16 July at Winnersh, from 08:45 – 16:45.

For more details, see the Agilent site »

8:30 – 9:00 AM Registration
9:00 – 9:05 AM Introduction
9:05 – 10:30 AM Challenges and Solutions for Impedance Measurements – Will Attoh (Application Engineer at Agilent Technologies)
10:30 – 10:45 AM Break
10:45 – 12:00 AM Dielectric Characterization of Materials- Clive Barnett (Application Engineer at Agilent Technologies)
12:00 – 1:00 PM Lunch and Hands-On Demo Session
1:00 – 1:45 PM Quasi Optical Systems to determine complex material properties-Kevin Pike (Project Scientist at TK Instruments)
1:45 – 2:30 PM Expanding Impedance Measurement to Nanoscale – Dr Matthias Fenner(Application Engineer, Agilent Technologies)
2:30 – 2:50 PM Break
2:50 – 3:30 PM Graphene fabrication and characterisation by Dr. Shakil A Awan and Antonio Lombardo from the Cambridge Research Centre and in the Nanomaterials and Spectroscopy Group.
3:30 – 4:15 PM Agilent’s Role in Novel Materials Research: Techniques to characterize graphene and graphene-based devices – Dr. Stewart Wilson (European Business Manager for Parametric Test Equipment, Agilent)
4:15 – 5:30 PM (Optional) Coffee and discussion with Specialists/ Hands-on with Instruments

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