JTAG works with 6TL for combined test method
JTAG Technologies is working with test integration firm 6TL Engineering to offer a combined boundary scan and functional test system.
JTAG Technologies has introduced a support option for 6TL’s YAVJTAG and YAVJTAH modules, which allows 6TL users to provide JTAG Test and ISP (in-system-programming) capabilities.
It uses the firms ProVision and Production Integration Packages (PIP) software platforms.
“We are finding more and more opportunities where complementary test techniques, such as boundary-scan and functional test, provide the optimum solution for our customers,” said Peter van den Eijnden, managing director of JTAG Technologies.
The YAV9JTAG and YAV9JTAH tester cards are part of 6TL’s ‘YAV’ series, used for building functional test systems.
Both units offer over 100 channel of digital I/O that can be controlled by a JTAG (IEEE std. 1149.1) interface and are connected to the target to extend the coverage of boundary-scan through to PCB connectors and/or test points.
“We developed the YAV JTAG hardware to satisfy customer demands for integrating boundary-scan scan and functional test techniques in our compact system platform,” said David Batet, sales director from 6TL.
The YAV9JTAG also includes an embedded boundary-scan controller that is compatible with JTAG Technologies’ developer and run-time systems making this a self-contained JTAG tester.
The YAV9JTAH on the other hand features eight each of analogue measurement and stimulus channels in addition to the digital I/O plus two serial (RS232) ports.
Control of and taking measurements from the YAV9JTAH is achieved via a boundary-scan controller, such as JTAG Technologies’ JT 37×7 ‘DataBlaster’ family, the more compact JT 3705/USB Explorer model or even the YAV9JTAG companion product.Tags: 6TL, combined test, customer demands, functional test systems, JTAG, JTAG Technologies, test, test techniques