Keithley aims tester at high power devices
For characterising power semiconductors up to 3kV and 100A, including GaN and SiC devices, Keithley has introduced a modern spin on the traditional parametric curve tracer.
“Many power device developers have told us they like the dynamic range and ease of use of a traditional curve tracer, but they know they need more flexibility in configuring the measurement channels, as well as the accuracy, capability, and graphical user interface that a modern parametric analyser offers,” said Keithley staff technologist Lee Stauffer.
Each tester is a bundle of precision power supplies, measuring instruments, software, and a test fixture.
Seven bundles cover a broad range of high power semiconductors.
Each allows more measurement channels to be added without return to the factory, to increase voltage or current capacity for example. Test power comes from the firm’s own SourceMeter products.
Applications are expected in characterising and testing components for research, reliability analysis and failure analysis; by applications engineers, device designers, and incoming device inspectors.
The software is the Basic Edition of Keithley’s automated characterisation suite, and provides test libraries for mosfets, bipolar transistors, triacs, diodes, and IGBTs.
“Its ‘trace’ mode uses an on-screen slider control that works much like the power control knob on a traditional analogue curve tracer. This allows users to control the level of voltage and current levels sourced interactively and to see how the power device responds in real time,” claimed Keithley. “The software’s ‘parametric’ mode provides a fill-in-the-blanks GUI to configure a test precisely, and a comprehensive set of tools for precise parameter extraction.”
Cabling and adapters are included, as well as sample power devices.