NI offers parallel test of multi-pin chips
National Instruments has added to its line of PXI SMUs for parallel testing of multi-pin semiconductors in automated test systems.
The NI PXIe-4143 SMU offers 600,000 samples per second and four channels and expands the multichannel SMU output range to 24V at 150mA.
It offers four SMU channels with up to 600kS/s sampling rate to measure fast transient responses.
There is four-quadrant output capability of 24V at 150mA, complementing preexisting NI SMU capabilities for sourcing and sinking.
Measurement sensitivity is 10pA.