Keithley Instruments announces a new C-V measurement instrument for its Model 4200-SCS Semiconductor Characterization System. The Model 4200-CVU instrument comes as a module that plugs into any available instrument slot of the Model 4200-SCS, allowing fast and easy capacitance measurements from femtoFarads (fF) to nanoFarads (nF), at frequencies from 10kHz to 10MHz.

According to Keithley Instruments, it provides intuitive point-and-click setup, simple cabling, and built-in element models that eliminate the guesswork in obtaining valid C-V measurements. Users of all experience levels can perform C-V tests as if they were experts. Visit http://www.keithley.com/pr/078 for more information.

The Model 4200-CVU includes an extensive set of test libraries, greatly increasing test efficiency. Even more efficiency is possible with Keithley’s Model 4200-LS-LC-12, a special switch matrix and card with cables and adapters that enable tightly integrated C-V/I-V testing with a single prober touchdown. The optional Model 4200-PROBER-KIT allows easy connection of the Model 4200-SCS to the most widely used probers. The net result is comprehensive C-V testing that is as easy to set up and run as I-V tests.

Availability

The Model 4200-CVU and optional kits will be available December 1, 2007. For more information, visit http://www.keithley.com/pr/078.