Keithley Instruments has added new software libraries and hardware enhancements to its model 4200-SCS solar cell characterization system.

An extended frequency range means the system can be used for testing organic semiconductors such as organic light-emitting diodes (OLEDs).

The V7.2 upgrade includes nine new solar cell test libraries and an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability.

The new test libraries expand the Model 4200-SCS’s capabilities for solar cell I-V, C-V, and resistivity testing applications.

The software upgrade also supports Drive-Level Capacitance Profiling (DLCP), which provides defect density information on thin film solar cells.

The 4200-CVU test system’s frequency range has been expanded to 1kHz–10MHz from 10kHz–10Mz to support DLCP testing.

This extended frequency range also expands the system’s applications, providing support for testing flat panel LCDs and organic semiconductors such as organic light-emitting diodes (OLEDs).

More information: www.keithley.com