Goepel electronic has available a boundary scan test model library for Freescale processor types MPC85xx to support its VarioTAP emulation system.
The libraries enable a fusion of Boundary Scan test and JTAG emulation. As a result, embedded or external flash can be in-system programmed via the native processor function.
The system also supports interlaced Bus Emulation Tests (BET) and System Emulation Tests (SET) for extended JTAG/boundary scan functionality.
The models for Freescale MPC85xx processors enable flash programming and various emulation test functions. The adaptive streaming technology of the TAP signals allows emulation tests to be executed in parallel or interactively with boundary scan tests within a test program, whereby the number of TAPs is unlimited.
Using the firm’s Scanflex hardware platform up to 8 TAP can be actuated independently from or simultaneously to other I/O resources.
Agilent Technologies
Analog Devices
Harting
LEM
Maxim Integrated Products
NXP
Rohde & Schwarz
Tektronix
Toshiba
Yokogawa