Anritsu’s latest BERTWave series optical device measurement system combines BER measurements and eye pattern analysis in one package.
For remote measurement in production environments, the MP2100A has a built-in mixed remote command function for batch-processing multiple measurement commands to speed-up measurement and cut BER measurement times by about 30%.
It supports high-speed sampling, shortening the time required for eye pattern analysis, including mask tests.
Optical signal power is measured by analysing the extinction ratio eye pattern.
There is also a Bessel filter and calibration function required for measuring extinction ratio, supporting extinction ratio measurements as close as possible to the theoretical value.
Agilent Technologies
Analog Devices
Harting
LEM
Maxim Integrated Products
NXP
Rohde & Schwarz
Tektronix
Toshiba
Yokogawa