TRaC /Agilent offer Bluetooth compliance tester October 13 2009 - The Bluetooth test system, developed by TRaC engineers in conjunction with Agilent hardware engineering, is designed to provide a qualification service that includes RF, Profile and Protocol to the Bluetooth Specification... more
Agilent adds serial bus apps to 9000 series scopes October 06 2009 - Agilent Technologies has extended its mixed-signal and digital-storage oscilloscope range with two lower-cost 600MHz Infiniium 9000 series models... more
Agilent adds test support for eHRPD wireless August 05 2009 - Agilent Technologies has announced support for 1xEV-DO enhanced high-rate packet data (eHRPD) in its 8960 wireless communication test sets running the E6706C lab application software... more
Agilent ups measurement speed of power meters July 03 2009 - Frequency coverage spans 9 kHz to 110 GHz and single-sensor dynamic range is 50 to 90 dB, depending on the model. The measurement speed has been improved to 400-readings/second, twice that of the previous model... more
Agilent 5.7Mbit/s HSUPA test capability August 11 2008 - Agilent Technologies has added a 5.7Mbit/s HSUPA test capability for its W-CDMA/HSPA test application, which runs on the 8960 (E5515C) wireless communications test set. ... more
Agilent link test platform for OBSAI interconnects July 10 2008 - Agilent Technologies is offering a link test platform for Open Base Station Architecture Initiative (OBSAI) interconnects, supporting reference point 3, RP3-01, reference point 1, and Ethernet Interfaces used between the baseband subsystem and radiohead subsystems.... more
Agilent PXI-and LXI-based 15-bit arbitrary waveform generators May 07 2008 - Agilent offers PXI- and LXI-based 15-bit arbitrary waveform generators - the N6030A and N8241A - that are designed to create simultaneous wide-bandwidth and high-resolution signals for electronic testing of radar, satellite, telecom or military communication equipment.... more
Agilent oscilloscope probe ideal for extreme conditions November 21 2007 - Agilent Technologies is offering an oscilloscope probe for making measurements in environmental chambers and in other settings with extreme temperature conditions.... more
Agilent Technologies LXI-compliant power meter July 16 2007 - Agilent Technologies introduces its first LXI-compliant power meter which supports LAN-based automated measurements of peak, peak-to-average ratio and average power... more